Pca535 pca535c 16-bit i2c-bus and smbus, low esd protection exceeds 2000 v hbm per jesd22-a114, 200. Esds devices with human body model sensitivities of less than 200 volts may need additional protective measures beyond those specified in this standard. And user agreement with the download or use of the provided materials. Compatible with reflow, vapor phase and wave solder processes according to. Esd protection exceeds 2000 v hbm per jesd22-a114 and 1000 v cdm per jesd22-c101 latch-up protection exceeds 100 ma per. Recommended esd-cdm target levels status: reaffirmed may 2015: jep157 oct 200. Jesd74, early life failure rate calculation procedure for electronic components. Jesd22- a114 datasheets, jesd22- a114 pdf, jesd22- a114 circuit: vishay - surface. -40 to 85 c high-volume cmos process 20-pin so d, tssop pw, and hvqfn bs applications microcontroller and microprocessor-based systems. 2 level listed above is the passing level per ansi/esda/jedec js-001. 221 The 74hc283 is a high-speed si-gate cmos device and is pin compatible with low power schottky ttl lsttl. Esd protection: hbm eia/jesd22-a114-a exceeds 2000 v mm eia/jesd22-a115-a ex ceeds 200 v cdm.
931 Differences between jesd22-a114c, compared to its predecessor, jesd22-a114-b. Jesd22-a103 datasheet pdf 2 page - richtek technology corporation. Measured using human body model per jesd22 a114, machine model per jesd22. Esd hbm1000v as per jesd22 a114 and esd cdm1500v as per jesd22 c101. Tested to eia/jesd22-a114-a, rated to eia/jesd22-a114-b. 22-a101 test method a101 steady-state temperature humidity bias life test. 3 jedec document jep157 states that 250-v cdm allows safe manufacturing with a standard esd control process. To accelerate metal corrosion, particularly that of the metallizations on the die surface of the device - preconditioned - soak at 130c/85 rh for 6 to 100 hrs - biased: burn-in. You can find the datasheet of la m67f-v1ab-24-z here. Jesd22-a114f datasheet, cross reference, circuit and application notes in pdf format. 7 5kv human body model a port i/o to gnd jesd22-a114.
Human body model hbm, jedec: jesd22-a1142 all pins 0 2 vesd 1 kv iec61000-4-2 contact discharge3 all pins 0 1 1 electrostatic discharge esd to measure device sensitivity/immunity to damage caused by assembly line electrostatic discharges into the device. Esd protection: hbm eia/jesd22-a114-a exceeds 2000 v mm eia/jesd22-a115-a. , pa545a datasheet pdf, pinouts, data sheet, equivalent, schematic, cross reference, obsolete, circuits. Thermal resistance from junction to the top of the case. This document may be downloaded free of charge; however jedec retains the. 29 Jesd22-a114f, and the esda hbm standard, ansi/esd stm5. Withstands up to 2000v hbm applied between the electrical pins. Jesd22-a114 1 positive discharge and 1 negative discharge per pin for each pin combination 3 devices/level 0/30 150v class 0b 1. 1 18 february 18 and jedec standard jesd22- a114a and jedec standard jes22 - a 115 a applying one positive and one negative pulse for each pin combination, un-less different requirements in the detailed specification. This document may be downloaded free of charge, however eia retains the. 74ahct32 or gate datasheet pdf provided by d datasheet pdf. The esd tests are used to classify the electrostatic discharge of microcircuits. The 74hc283 adds two 4-bit binary words an plus bn plus the incoming carry cin. 74hc14d: description hex inverting schmitt trigger: download 23 pages. 68 inch general purpose 5 x 7 dot matrix alphanumeric displays,alldatasheet, datasheet, datasheet search site for electronic components and semiconductors, integrated circuits, diodes, triacs, and other semiconductors. Electrostatic discharge esd sensitivity testing human body. This accomplishment was a significant advance for the industry.
Details, please download the on semiconductor soldering and. B vpr vapor phase reflow chamber capable of operating from 215 c - 21 c and/or 235 5 c with appropriate fluids. Jedec jesd 22-a114, revision f, december 2008 - electrostatic discharge esd sensitivity testing human body model hbm this test method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic human body model hbm discharge esd. 530 Pa545a datasheet: 4-channel i2c-bus switch with interrupt logic and reset, pa545a pdf download nxp semiconductors. However, js-001-2010 did not address several important technical issues. The improvements include higher drive capability, 5 v i/o tolerance, lower supply current, individual i/o. Jedec standard jesd22?A114?B, electrostatic discharge esd sensitivity testing human body model hbm this method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic human body model hbm discharge esd. Acceptable alternative test conditions and temperature tolerances are a through h, i, l, or m as defined in table 1 of jesd22-a104, temperature cycling. Status: supersededby ansi/esda/jedec js-001, april 2010. Jesd22-a101 datasheet pdf - avago technologies limited. 2 esd ratings value unit vesd electrostatic discharge human body model hbm, per ansi/esda/jedec js-00112 2000 charged-device model cdm, per jedec specification jesd22- v c1013 500. Thanks does anyone know why the picture wont download in the pdf intructions.
Esd rating according to jesd22-a114 / contact discharge. L jesd22-a114b for hbm l jesd22-a115a for mm l refer: microchip overview, quality systems and customer interface systems handbook ds0016 l manufacturing perspective l anti static work station l wrist band l grounded systems. S jedec standard jesd22-a114a human body model s jedec standard jesd22-a115a machine model s esd association standard draft ds5. This accomplishment was a significant advance for the industry, since it reduced the confusion and extra effort for maintaining two standards for the same test. Jesd22-a113-b page 2 test method a113-b revision of test method a113-a 2. 138 The latch-up test is used to check ic latch-up characteristics. Note for good correlation of results between moisturereflowindu ced stress. The binary sum appears on the sum outputs s1 to s4. 100 convection reflow system capable of maintaining the reflow profiles required by this standard. Doc-live - easy fast and trusted searching pdf files. This test method combines the main features of jedec jesd22-c101 and ansi/esd s5.
3 jesd22-c101 description the fxma108 is a configurable dual-voltage supply translator designed for both uni-directional and bi-directional voltage translation between two logic levels. Hbm human body model esd capability all pins except hv per jedec jesd22. Not all parts subjected to preconditioning were used for subsequent qualification testing. Jesd22-a104 datasheet 3mm yellow gaasp/gap led lamps - broadcom corporation. The pca555 is a 24-pin cmos device that provide 16 bits of general purpose parallel input/output gpio expansion for i2c/smbus applications and was developed to enhance the philips family of ic i/o expanders. 211 Rak2245 pi hat is a module with raspberry pi form factor. Condition duration lots/ss fail/qty result pre-conditioning j-std020 / jesd22 a113 pc msl and 3 x reflow 2 x 462 0 / 24 pass temperature cycling jesd22 a104 tc -55c to 150c. 1 total axial whisker length: the distance between the finish surface and the tip of the whisker that would exist if the whisker were straight and perpendicular to the surface. Esd protection: hbm eia/jesd22-a114-a exceeds 2000 v. Jesd22-a104c revision of jesd22-a104-b may 2005 jedec solid state technology association. Device sensitivity to esd is determined by test methods such as jesd22 a114.
, pca558 datasheet pdf, pinouts, data sheet, equivalent, schematic, cross reference, obsolete, circuits. Notice jedec standards and publications contain material that has been prepared, reviewed, and approved through the jedec board of directors. This test method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic human body model hbm discharge esd. Device sensitivity to esd is determined by test methods such as jesd22-a114. Jesd6, information requirements for the qualification of silicon devices. 81 Jesd22-a114 hbm class 3a pass esd cdm jesd22-c101 cdm class c3 pass environmental stress test results: test description abbr. Pdf: download: html: 74hc14d datasheetpdf 2 page - nxp semiconductors: part no. If more than one pulse is requested, minimum time between pulses is. Esd human body model hbm class 3a jesd22-a114-e 8 kv. Downloading this file, the individual agrees not to charge for or resell the resulting. The 74hc283 is specified in compliance with jedec standard no. Esd protection exceeds 2000v hbm per jesd22-a114, 200v mm per jesd22-a115, and 1000v cdm per jesd22-c101 jedec standard jesd78 latch-up testing exceeds 100 ma operating temperature range. 22-a110 test method a110 highly-accelerated temperature and humidity stress test hast 1. Jesd22-a104, standard for temperature cycling ipc 7530, guidelines for temperature profiling for mass soldering reflow. The steady-state temperature humidity bias life test. Raspberry pi such as raspberry pi 3 model b as a complete. The highly-accelerated temperature and humidity stress test is performed for the. Jesd22 series, reliability test methods for packaged devices jesd46, guidelines for user notification of product/process changes by semiconductor suppliers. Tools tab on the parts product summary page to download the.